Abstract

This presentation explores the extraction and interpretation of scattering information from full polarimetric Synthetic Aperture Radar (PolSAR) data. Three fundamental descriptors are introduced: a polarimetric scattering-type parameter derived from the scattering matrix, a novel scattering purity measure that addresses limitations of conventional metrics, and a scattering complexity parameter that captures interactions among multiple scattering mechanisms. The proposed framework provides a physically consistent and basis-invariant representation of scattering behavior. Also, some recently proposed descriptors are presented, and their effectiveness is demonstrated through applications in crop monitoring, vegetation characterization, and urban mapping using multi-frequency SAR datasets. The results highlight the potential of these descriptors for improved geophysical interpretation and enhanced remote sensing applications.

Prof. Avik Bhattacharya

Indian Institute of Technology Bombay

Venerdì 20 Marzo 2026, ore 12:30
Exploring Scattering Information from Polarimetric SAR Data

Dipartimento di Ingegneria Elettrica e delle Tecnologie dell’Informazione (DIETI) Aula CL-T-6, Edificio 1 - Via Claudio 21, Napoli